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Toward an understanding of bug fix patterns

TitleToward an understanding of bug fix patterns
Publication TypeJournal Article
Year of Publication2009
AuthorsPan, K, Kim, S, Whitehead, Jr., JE
JournalEmpirical Softw. Engg.
Volume14
Pagination286–315
ISSN1382-3256
KeywordsSIL
DOI10.1007/s10664-008-9077-5
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