Bug Classification Using Program Slicing Metrics

TitleBug Classification Using Program Slicing Metrics
Publication TypeConference Paper
Year of Publication2006
AuthorsPan, K, Kim, S, Whitehead, Jr., JE
Conference NameSCAM ’06: Proceedings of the Sixth IEEE International Workshop on Source Code Analysis and Manipulation
PublisherIEEE Computer Society
Conference LocationWashington, DC, USA
ISBN Number0-7695-2353-6
KeywordsSIL
DOI10.1109/SCAM.2006.6
Full Text
Taxonomy upgrade extras: