Toward an understanding of bug fix patterns
| Title | Toward an understanding of bug fix patterns |
| Publication Type | Journal Article |
| Year of Publication | 2009 |
| Authors | Pan, K., S. Kim, and J. E. Whitehead, Jr. |
| Journal | Empirical Softw. Engg. |
| Volume | 14 |
| Pagination | 286–315 |
| ISSN | 1382-3256 |
| Keywords | SIL |
| DOI | http://dx.doi.org/10.1007/s10664-008-9077-5 |
